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המונחים - הכל | מציג 1-50 מתוך 524 מונחים |
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ArF excimer laser |
electron |
quasistatic C-V |
Auger electron |
Depleted Substrate Transistor [DST] |
hot electron |
I2L |
ammonia, NH3 |
Ideal MOS |
ammonium hydroxide, NH4OH |
bonded SOI |
etch anisotropy |
fully depleted SOI, FD SOI |
anodization |
titanium nitride, TiN |
plasma anodization |
extreme UV [EUV] |
antimony, Sb |
Extreme UV, EUV |
Analog to Digital Converter [ADC] |
high-frequency C-V |
activation energy |
deep UV [DUV] |
hard bake |
Debye length |
soft bake |
diffusion length |
Hall effect |
channel length |
emitter push effect |
gate length |
Kirk effect |
Brillouin zone |
argon, Ar |
denuded zone [DZ] |
BBUL packaging |
blank |
arsine, AsH3 |
alternative dielectrics |
arsenic, As |
autodoping |
KOH |
Laser interferometry |
leak detector |
aluminum, conductor, Al |
hole |
aluminum, contaminant, Al |
boron |
ellipsometry |
inter-layer, inter-level dielectric, ILD |
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עמודים:
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